The LD 8900HDR Far-Field Profiler uses goniometric methodology to measure true 3-dimensional profiles of optical components with up to 93 dB dynamic range.
All measurements are taken with the emitting fiber, planar waveguide, laser diode or LED inserted directly into the center of the instrument's radial measurement area. For optical fiber, the far-field distribution pattern is acquired without bending the fiber. Bending the fiber can cause analysis and reporting inaccuracies. Parameters measured for optical fiber are:

Measurement Parameters:
• Laser Diodes on wafer, chip or package
• Effective Area (Aeff):
• Numerical Aperture (NA):
• Direct measurement of Waveguides and other devices
• 3D and Single Axis
• 180 degree field of view (FOV)
• LED Profiler configuration with 260 degree FOV

Features:
• Spectral range: InGaAs detector: 800-1700nm / Silicon available (350-800nm)
• Scan range: ±90°