NanoScan Near-field profiling Measuring the near field of sources such as laser diodes, VCSELs, optical fiber, and/or waveguides can be a difficult task. Accurate measurement of such small sources to the micron level requires high precision in the optical and mechanical design.
Near-Field Profilers (NFPs) covering a wide range of wavelengths:
- NFP-980: with 60:1 magnification and 1μm resolution, specifically designed for measurement of 980nm pump lasers, is also ideal for other applications in the wavelength range between 700nm–1100 nm
- NFP-1550: with 40:1 magnification and 2.6μm resolution, is designed for use in characterizing sources in the 1300-1600nm telecommunications wavelength band.
- NFP-VIS: is equipped with the NanoScan SI/9/5 scanhead and the 60:1 microscope objective, AR coated for the 400–700nm wavelength range. UV Wavelengths below 360nm can also be accommodated with an optional UV corrected microscope objective..
- NFP-Pyro: For higher power and longer wavelength beams - from 190nm to 20μm is available. Can measure beam powers up to 100W.
- Optional UV Wavelengths below 380nm with an optional UV corrected microscope objective.
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